SASAKI Takaoki | Semiconductor Leading Edge Technologies (Selete), AIST
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概要
Semiconductor Leading Edge Technologies (Selete), AIST | 論文
- Importance of Leakage Current Noise Analysis for Accurate Lifetime Prediction of High-k Gate Dielectrics
- Work Function Modulation by Segregation of Indium through Tungsten Gate For Dual-Metal Gate CMOS Applications