Yajima Toshihisa | Department of Image Engineering, Tokyo Polytechnic University, 1583 Iiyama, Atsugi, Kanagawa 243-0297, Japan

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概要

関連著者

Tango Hiroyuki
Department Of Image Engineering Tokyo Polytechnic University
Satoh Toshifumi
Department Of Image Engineering Tokyo Polytechnic University
Nogami Yukisato
Department Of Image Engineering Tokyo Polytechnic University:(present Office)taiyo System Technology
Yamagata Masahiro
Department of Image Engineering, Tokyo Polytechnic University, 1583 Iiyama, Atsugi, Kanagawa 243-0297, Japan
Usami Gen
Department of Image Engineering, Tokyo Polytechnic University, 1583 Iiyama, Atsugi, Kanagawa 243-0297, Japan
Yamaji Toshihisa
Department of Image Engineering, Tokyo Polytechnic University, 1583 Iiyama, Atsugi, Kanagawa 243-0297, Japan
Yajima Toshihisa
Department of Image Engineering, Tokyo Polytechnic University, 1583 Iiyama, Atsugi, Kanagawa 243-0297, Japan
Nogami Yukisato
Department of Image Engineering, Tokyo Polytechnic University, 1583 Iiyama, Atsugi, Kanagawa 243-0297, Japan

著作論文

Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon Thin Film Transistors

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