Koiwa Ichiro | Semiconductor Technology Laboratories, Oki Electric Industry Co., Ltd.

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• KOIWA Ichiroの詳細を見る
• 同名の論文著者
• Semiconductor Technology Laboratories, Oki Electric Industry Co., Ltd.の論文著者

Semiconductor Technology Laboratories, Oki Electric Industry Co., Ltd. | 論文

• Shift in Threshold Voltage and Schottky Barrier Height of Molybdenum Gate Gallium Arsenide Field Effect Transistors after High Forward Gate Current Test
• Schottky Characteristics of InAlAs Grown by Metal-Organic Chemical Vapor Deposition
• Development of the High Aspect-Ratio Y-Shaped Gate Process for HEMT
• The Change of Mo/GaAs Schottky Characteristics by the Forward Gate Current

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