Lee Seung-Yun | IT Convergence and Component Laboratory, Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Korea
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概要
- Lee Seung-Yunの詳細を見る
- 同名の論文著者
- IT Convergence and Component Laboratory, Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Koreaの論文著者
関連著者
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Lee Seung-yun
It Convergence And Component Laboratory Electronics And Telecommunications Research Institute
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Yoon Sung-min
It Convergence And Component Laboratory Electronics And Telecommunications Research Institute
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Lee Nam-yeal
It Convergence And Component Laboratory Electronics And Telecommunications Research Institute
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Park Young-sam
It Convergence And Component Laboratory Electronics And Telecommunications Research Institute
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Choi Kyu-jeong
It Convergence And Component Laboratory Electronics And Telecommunications Research Institute
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Yu Byoung-gon
It Convergence And Component Laboratory Electronics And Telecommunications Research Institute
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Yoon Sung-Min
IT Convergence and Component Laboratory, Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Korea
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Lee Seung-Yun
IT Convergence and Component Laboratory, Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Korea
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Yu Byoung-Gon
IT Convergence and Component Laboratory, Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Korea
-
Choi Kyu-Jeong
IT Convergence and Component Laboratory, Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Korea
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Park Young-Sam
IT Convergence and Component Laboratory, Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon 305-350, Korea
著作論文
- Electrical Characterization of Nonvolatile Phase-Change Memory Devices Using Sb-Rich Ge–Sb–Te Alloy Films
- Dry Etching of Ge2Sb2Te5 Thin Films into Nanosized Patterns Using TiN Hard Mask