KOBAYASHI Tetsunori | SOC Division, Renesas Technology Corporation
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概要
SOC Division, Renesas Technology Corporation | 論文
- Detection of CMOS Open Node Defects by Frequency Analysis(Dependable Computing)
- CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component(Fault Detection)(Test and Verification of VLSI)