Hirosawa Ichiro | Device Analysis and Evaluation Technology Center, NEC Corporation
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概要
Device Analysis and Evaluation Technology Center, NEC Corporation | 論文
- Imaging p-n Junctions by Scanning Auger Microscopy
- Nanometer-Scale Imaging of Lattice Deformation with Transmission Electron Micrograph
- Influence of Annealing on Molecular Orientation of Rubbed Polyimide Film Observed by Reflection Ellipsometry
- Phase Breaking of Coherent Electron Waves in Dot Array Systems ( Quantum Dot Structures)
- Trajectory Transition Due to Gate Depletion in Corrugation Gated Quantum Wires