TAKEISHI A.[et | TDK CORPORATION

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TDK CORPORATION | 論文

• Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes
• Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes
• Residual Stress of Multilayer Ceramic Capacitors with Ni-Electrodes (Ni-MLCCs)
• High Speed System for Measuring Electromagnetic Field Distribution(Electromagnetic Compatibility (EMC))
• Generation of a Novel Apoptosis-Resistant Hepatoma Cell Line

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