Su Alex | Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C

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概要

関連著者

Wu Meng-chyi
Institute Of Electronic Engineering National Tsing Hua University
Chen Shih-hui
Institute Of Electronic Engineering National Tsing Hua University
Gong Jeng
Institute Of Electronic Engineering National Tsing Hua University
Wu Meng-chyi
Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C
Su Alex
Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C
Chen Shih-hui
Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C
Gong Jeng
Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C

著作論文

Hot-Carrier Degradation Rate of High-Voltage Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors under Maximum Substrate Current Stress Conditions

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