Park Young | School of Electrical Engineering and Computer Science and Nano-Systems Institute (NSI-NCRC), Seoul National University, Seoul 151-744, Korea
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- 同名の論文著者
- School of Electrical Engineering and Computer Science and Nano-Systems Institute (NSI-NCRC), Seoul National University, Seoul 151-744, Koreaの論文著者
School of Electrical Engineering and Computer Science and Nano-Systems Institute (NSI-NCRC), Seoul National University, Seoul 151-744, Korea | 論文
- Design Technique for Ramped Gate Soft-Programming in Over-Erased NOR Type Flash EEPROM Cells
- Spatial Distribution of Oxide Traps in Stressed Flash Memory