Noh Joo | Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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概要
- Noh Joo Hyonの詳細を見る
- 同名の論文著者
- Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Koreaの論文著者
関連著者
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Kim Chang
Department Of Biochemistry University Of Oxford
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Noh Joo
Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Ryu Seung
Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Jo Sung
Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Jo Sung
Department Of Metallurgical Engineering Yonsei University
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Kim Jong
Department Of Agricultural Bio-resources National Academy Of Agricultural Science Rural Development
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Baik Hong
Department of Advanced Materials Engineering, Yonsei University, Seoul 120-749, Korea
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Baik Hong
Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea
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Lee Se-Jong
Department of Material Engineering, Kyungsung University, Busan 608-736, Korea
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Ryu Seung
Department Of Parmacy Keimyung University Nutrition Support Team
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Kim Chang
Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Lee Se-Jong
Department of Materials Science and Engineering, Kyungsung University, Busan 608-736, Korea
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Kim Jong
Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea
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Jo Sung
Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea
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Ryu Seung
Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea
著作論文
- Low-Voltage-Driven Bottom-Gate Amorphous Indium–Gallium–Zinc-Oxide Thin-Film Transistors with High Dielectric Constant Oxide/Polymer Double-Layer Dielectric
- Characterization of CF4 Plasma-Treated Indium–Tin-Oxide Surfaces Used in Organic Light-Emitting Diodes by X-ray Photoemission Spectroscopy
- Erratum: "Characterization of CF4 Plasma-Treated Indium–Tin-Oxide Surfaces Used in Organic Light-Emitting Diodes by X-ray Photoemission Spectroscopy"