Yamada Hirofumi | Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510, Japan
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- Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510, Japanの論文著者
Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510, Japan | 論文
- Noncontact Atomic Force Microscopy Investigation of Phase-Separated Alkanethiol Self-Assembled Monolayers with Different Head Groups
- Interface Properties of Metal–Oxide–Semiconductor Structures on 4H-SiC{0001} and ($11\bar{2}0$) Formed by N2O Oxidation
- Orientation Control of Molecular Chains in Polymers Using Atomic Force Microscopy
- Selective Embedded Growth of 4H–SiC Trenches in 4H–SiC(0001) Substrates Using Carbon Mask
- Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy