Lee Jong-Ho | School of Electronic and Electrical Engineering, Kyungpook National University, Bldg. #11-503, 1370 Sankyuk-Dong, Buk-Gu, Daegu 702-701, Korea
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- 同名の論文著者
- School of Electronic and Electrical Engineering, Kyungpook National University, Bldg. #11-503, 1370 Sankyuk-Dong, Buk-Gu, Daegu 702-701, Koreaの論文著者
School of Electronic and Electrical Engineering, Kyungpook National University, Bldg. #11-503, 1370 Sankyuk-Dong, Buk-Gu, Daegu 702-701, Korea | 論文
- Negative Bias Temperature Instability of Bulk Fin Field Effect Transistor
- Impact Ionization Behavior in Bulk Fin Field Effect Transistors with Fin Body Width and Bias Conditions