ROY Scott | Device Modelling Group, Dept. of Electronics and Electrical Engineering University of Glasgow
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- Device Modelling Group, Dept. of Electronics and Electrical Engineering University of Glasgowの論文著者
Device Modelling Group, Dept. of Electronics and Electrical Engineering University of Glasgow | 論文
- Impact of Oxide Thickness Fluctuation on MOSFETs Gate Tunnelling
- RTS amplitudes in decanano n-MOSFETs with conventional and high-κ gate stacks