Kohara Takahiro | Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan

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概要

関連著者

Mizobuchi Koichi
Disp Development Texas Instruments Japan
Lee Woonghee
Graduate School Of Engineering Tohoku University
Shigetoshi Sugawa
Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Koichi Mizobuchi
DISP Development, Texas Instruments Japan, Inashiki, Ibaraki 300-0496, Japan
Kohara Takahiro
Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Takahiro Kohara
Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan

著作論文

A Complementary Metal–Oxide–Semiconductor Image Sensor with 2.0 e- Random Noise and 110 ke- Full Well Capacity and Noise Measurement of Pixel Transistors Using Column Source Follower Readout Circuits

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