Ryu Sang | Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-dong, Yuseong-gu, Daejeon, 305-700, Korea

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概要

• Ryu Sang Oukの詳細を見る
• 同名の論文著者
• Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-dong, Yuseong-gu, Daejeon, 305-700, Koreaの論文著者

関連著者

• PARK Young

  Basic Research Laboratory, Electronics and Telecommunications Research Institute

• CHOI Yong

  System LSI Division, Samsung Electronics Co.

• KANG Sung

  System LSI Division, Samsung Electronics Co.

• YOON Sung

  Basic Research Laboratory, Electronics and Telecommunications Research Institute

• RYU Sang

  Basic Research Laboratory, Electronics and Telecommunications Research Institute

• YU Byoung

  Basic Research Laboratory, Electronics and Telecommunications Research Institute

• Yoon Seung

  System Lsi Division Samsung Electronics Co.

• Chung Chil

  System Lsi Division Samsung Electronics Co.

• Han Jeong

  System Lsi Division Samsung Electronics Co.

• Yoon Sung

  Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-dong, Yuseong-gu, Daejeon, 305-700, Korea

• Ryu Sang

  Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-dong, Yuseong-gu, Daejeon, 305-700, Korea

• Yu Byoung

  Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-dong, Yuseong-gu, Daejeon, 305-700, Korea

• Yoon Seung

  System LSI Division, Samsung Electronics Co., Yongin, Gyeonggi-do, 449-711, Korea

• Han Jeong

  System LSI Division, Samsung Electronics Co., Yongin, Gyeonggi-do, 449-711, Korea

• Chung Chil

  System LSI Division, Samsung Electronics Co., Yongin, Gyeonggi-do, 449-711, Korea

• Choi Yong

  System LSI Division, Samsung Electronics Co., Yongin, Gyeonggi-do, 449-711, Korea

• Kang Sung

  System LSI Division, Samsung Electronics Co., Yongin, Gyeonggi-do, 449-711, Korea

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著作論文

• Highly Reliable Flash Cell for Low Power Application

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