Yamaguchi Masatsune | Graduate School of Science and Technology, Chiba University, Chiba 263-8522, Japan
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概要
- Yamaguchi Masatsuneの詳細を見る
- 同名の論文著者
- Graduate School of Science and Technology, Chiba University, Chiba 263-8522, Japanの論文著者
関連著者
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Omori Tatsuya
Graduate School Of Engineering Chiba University
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Hashimoto Ken-ya
Graduate School Of Engineering Chiba University
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Yamaguchi Masatsune
Graduate School of Science and Technology, Chiba University, Chiba 263-8522, Japan
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Yamaguchi Masatsune
Graduate School of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba 263-8522, Japan
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Hashimoto Ken-ya
Graduate School of Science and Technology, Chiba University, Chiba 263-8522, Japan
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Thalmayr Florian
Graduate School of Science and Technology, Chiba University, Chiba 263-8522, Japan
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UEDA Masanori
FUJITSU LABORATORIES LIMITED, Peripheral System Laboratories
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Ueda Masanori
Taiyo Yuden Ltd., Akashi, Hyogo 674-8555, Japan
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Kashiwa Keisuke
Graduate School of Science and Technology, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba 263-8522, Japan
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Omori Tatsuya
Graduate School of Science and Technology, Chiba University, Chiba 263-8522, Japan
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Omori Tatsuya
Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan
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Wu Nan
Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan
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Kashiwa Keisuke
Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan
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Wang Yiliu
Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan
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Ueda Masanori
Fujitsu Laboratories Ltd., Akashi, Hyogo 674-8555, Japan
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Wu Nan
Graduate School of Engineering, Chiba University, Chiba 263-8522, Japan
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Kashiwa Keisuke
Graduate School of Engineering, Chiba University, Chiba 263-8522, Japan
著作論文
- Quantitative Analysis of Power Leakage in an Film Bulk Acoustic Resonator Device at the Antiresonance Frequency
- Simplified Boundary Modeling for Resonating Structures by Scattering Analysis
- Study on the Frequency Dependence of Lateral Energy Leakage in RF Bulk Acoustic Wave Device by Fast-Scanning Laser Probe System
- A Full-Wave Analysis of Surface Acoustic Waves Propagating on a SiO2 Overlay/Metal Grating/Rotated $Y$-Cut $X$-Propagating LiNbO3 Substrate Structure