Kumeda Minoru | Graduate School of Natural Science and Technology, Kanazawa University, Kanazawa 920-1192, Japan
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概要
- Kumeda Minoruの詳細を見る
- 同名の論文著者
- Graduate School of Natural Science and Technology, Kanazawa University, Kanazawa 920-1192, Japanの論文著者
関連著者
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Kumeda Minoru
Graduate School of Natural Science and Technology, Kanazawa University, Kanazawa 920-1192, Japan
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Kumeda Minoru
Graduate School of Natural Science and Technology, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan
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Kawae Takeshi
Graduate School Of Natural Science And Technology Kanazawa University
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Morimoto Akiharu
Graduate School Of Natural Science And Technology Kanazawa University
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Matoba Akinari
Graduate School Of Natural Sci. & Technol. Kanazawa Univ.
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Okamura Soichiro
Department Of Applied Physics Faculty Of Science Science University Of Tokyo
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Sasaki Kimihiro
Graduate School Of Natural Sci. & Technol. Kanazawa Univ.
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Li Ying
Graduate School Of Agriculture Hokkaido University
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Tsuda Hisashi
Graduate School Of Natural Science And Technology Kanazawa University
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Naganuma Hiroshi
Department Of Applied Physics Faculty Of Science Tokyo University Of Science
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Matoba Akinari
Graduate School of Natural Science and Technology, Kanazawa University, Kanazawa 920-1192, Japan
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Okamura Soichiro
Department of Applied Physics, Faculty of Science, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan
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Yamada Satoru
Ishikawa National College of Technology, Tsubata, Ishikawa 920-0392, Japan
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Morimoto Akiharu
Graduate School of Natural Science and Technology, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan
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Chen Guanghua
Materials Science and Engineering, Beijing University of Technology, Beijing 100022, China
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Kawae Takeshi
Graduate School of Natural Science and Technology, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan
著作論文
- Composition dependence in BiFeO3 film capacitor with suppressed leakage current by Nd and Mn cosubstitution and their ferroelectric properties
- Crystallinity and Thermoelectric Properties of Si/GeB Multilayers Prepared with Si Buffer Layer and SiO2 Substrates
- Structural Properties of Silicon Thin Films Prepared by Hot-Wire-Assisted Electron Cyclotron Resonance Chemical Vapor Deposition