Sasaki Nobuo | Sharp Corp., 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan

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概要

関連著者

KITAHARA Kuninori
Interdisciplinary Faculty of Science and Engineering, Shimane University
Yamamoto Kenichi
Interdisciplinary Graduate School of Science and Engineering, Shimane University, Matsue 690-8504, Japan
Ohashi Yasutaka
Interdisciplinary Graduate School of Science and Engineering, Shimane University, 1060 Nishikawatsu, Matsue 690-8504, Japan
Sasaki Nobuo
Sharp Corp., 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
Yamamoto Kenichi
Interdisciplinary Graduate School of Science and Engineering, Shimane University, 1060 Nishikawatsu, Matsue 690-8504, Japan

著作論文

Electrochemical and Raman-Scattering Characterizations of Defects in Polycrystalline Silicon Thin Films Formed by Excimer-Laser Annealing, Solid-Phase Crystallization, and Continuous-Wave Laser Lateral Crystallization

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