Okumura Hajime | Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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概要
- Okumura Hajimeの詳細を見る
- 同名の論文著者
- Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japanの論文著者
関連著者
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Okamoto Mitsuo
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Fukuda Kenji
Energy Semiconductor Electronics Research Laboratory, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Okumura Hajime
Energy Semiconductor Electronics Research Laboratory, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Okumura Hajime
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Fukuda Kenji
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Okamoto Mitsuo
Energy Semiconductor Electronics Research Laboratory, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Senzaki Junji
Energy Semiconductor Electronics Research Laboratory, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Shimozato Atsushi
Energy Semiconductor Electronics Research Laboratory, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Kojima Kazutoshi
Energy Semiconductor Electronics Research Laboratory, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Arai Kazuo
Energy Semiconductor Electronics Research Laboratory, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Yatsuo Tsutomu
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
著作論文
- Evaluation of 4H-SiC Thermal Oxide Reliability Using Area-Scaling Method
- Electrical Properties of 4H-Silicon Carbide Complementary Metal–Oxide–Semiconductor Devices with Wet-Processed Gate Oxide