スポンサーリンク
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan | 論文著者
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Okamoto Mitsuo
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Yatsuo Tsutomu
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Okumura Hajime
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Fukuda Kenji
Energy Semiconductor Electronics Research Laboratory (ESERL), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan