Masanari Okada | Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan

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概要

関連著者

AO Jin-Ping
Institute of Technology and Science, The University of Tokushima
Ohno Yasuo
Institute Of Technology And Science The University Of Tokushima
Hu Cheng-yu
Institute Of Technology And Science The University Of Tokushima
Yasuo Ohno
Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan
Nokubo Hiroyuki
Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan
Okada Masanari
Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan
Masanari Okada
Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan
Hiroyuki Nokubo
Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan
Jin-Ping Ao
Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan
Cheng-Yu Hu
Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan

著作論文

Metal–Insulator–Semiconductor Diode Characterization on n-GaN by Capacitance–Voltage Measurement at 150 °C

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