MERTENS Paul | Interuniversitary Micro-Electronics Center

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概要

• WOERLEE Pierre H.の詳細を見る
• 同名の論文著者
• Interuniversitary Micro-Electronics Centerの論文著者

Interuniversitary Micro-Electronics Center | 論文

• Current-Voltage Characteristics of Gate Oxides after Hard Breakdown
• Morphology Change of Artificial Crystal Originated Particles, and the Effect on Gate Oxide Integrity
• Breakdown and Recovery of Thin Gate Oxides
• Fabrication and Characterization of Artificial Crystal Originated Particles
• Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime

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