Tsurumi Daisuke | Analysis Technology Research Center, Sumitomo Electric Industries, Ltd., Yokohama 244-8588, Japan
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概要
- Tsurumi Daisukeの詳細を見る
- 同名の論文著者
- Analysis Technology Research Center, Sumitomo Electric Industries, Ltd., Yokohama 244-8588, Japanの論文著者
関連著者
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Tsurumi Daisuke
Analysis Technology Research Center, Sumitomo Electric Industries, Ltd., Yokohama 244-8588, Japan
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Hamada Kotaro
Analysis Technology Research Center, Sumitomo Electric Industries, Ltd., 1 Taya-cho, Sakae-ku, Yokohama 244-8588, Japan
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Hamada Kotaro
Analysis Technology Research Center, Sumitomo Electric Industries, Ltd., Yokohama 244-8588, Japan
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Kawasaki Yuji
Analysis Technology Research Center, Sumitomo Electric Industries, Ltd., Yokohama 244-8588, Japan
著作論文
- Energy-Filtered Secondary-Electron Imaging for Nanoscale Dopant Mapping by Applying a Reverse Bias Voltage
- Sensitive Site-Specific Dopant Mapping in Scanning Electron Microscopy on Specimens Prepared by Low Energy Ar