Lee Chul | National Cri Center For Semiconductor Nanorods And Department Of Materials Science And Engineering P
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National Cri Center For Semiconductor Nanorods And Department Of Materials Science And Engineering P | 論文
- Low-frequency noise characterizations of back-gate ZnO nanorod field-effect transistor structure (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Low-frequency noise characterizations of back-gate ZnO nanorod field-effect transistor structure (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Evaluating the Quantum Confinement Effect of Isolated ZnO Nanorod Single-Quantum-Well Structures Using Near-Field Ultraviolet Photoluminescence Spectroscopy