Bhat M. | Microelectronics Research Center Department Of Electrical & Computer Engineering And Materials S

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• Microelectronics Research Center Department Of Electrical & Computer Engineering And Materials Sの論文著者

Microelectronics Research Center Department Of Electrical & Computer Engineering And Materials S | 論文

• Highly Reliable Ultra Thin Gate Dielectrics for Dual-Gate CMOS Devices
• Superior Immunity to the Effects of Plasma-Induced Charging Damage on the Hot-Carrier Reliability of MOSFET's with NO-nitrided SiO_2 Gate Dielectrics

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