Sato Fumio | Image Devices Research Division Nhk Science And Technical Research Laboratory

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概要

• 同名の論文著者
• Image Devices Research Division Nhk Science And Technical Research Laboratoryの論文著者

関連著者

• Aoyama Mitsuru

  Research Institute Of Electronics Shizuoka University

• Yamaguchi Tomuo

  Research Institute Of Electronics Shizuoka University

• Jayatissa Ahalapitiya

  Research Institute Of Electronics Shizuoka University

• Sawada Kazuaki

  Research Institute Of Electronics Shizuoka University

• Sato Fumio

  Image Devices Research Division Nhk Science And Technical Research Laboratory

• 山口 剛士

  鳥取大学農学部附属鳥由来人獣共通感染症疫学研究センター

• YAMAGUCHI Tomuo

  Research Institute of Electronics, Shizuoka University

• AOYAMA Mitsuru

  Research Institute of Electronics, Shizuoka University

• SAWADA Kazuaki

  Research Institute of Electronics, Shizuoka University

• Yamaguchi Taichi

  Superconductivity Research Dept. Material Research Lab. Fujikura Ltd. :(present Address)quality Assu

• Yamaguchi T

  Toshiba Corp. Yokohama Jpn

• JAYATISSA Ahalapitiya

  Research Institute of Electronics, Shizuoka University

• Jayatissa A

  Research Institute Of Electronics Shizuoka University:(present Address)advanced Materials And Device

• SATO Fumio

  Image Devices Research Division, NHK Science and Technical Research Laboratory

• Aoyama M

  Japan Atomic Energy Agency

• Aoyama Makoto

  Advanced Photon Research Center Kansai Research Establishment Japan Atomic Energy Research Institute

• Sawada Kazuaki

  Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432, Japan

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著作論文

• Characterization of Interface Layer of Silicon on Sapphire Using Spectroscopic Ellipsometry
• Characterization of Interface Layer of Silicon on Sapphire Using Spectroscopic Ellipsometry

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