Kang Dae-gwan | Dept. Of Electronics Eng. And Inter-university Semiconductor Research Center Seoul National Universi
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Dept. Of Electronics Eng. And Inter-university Semiconductor Research Center Seoul National Universi | 論文
- V_-V_ Scaling for Low Power CMOS Circuit
- Improvement of Breakdown Voltage in SOI MOSFET Using Gate-Recess (GR) Structure