Li Jin-fu | Advanced Reliable Systems (ares) Laboratory Department Of Electrical Engineering National Central Un
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- Advanced Reliable Systems (ares) Laboratory Department Of Electrical Engineering National Central Unの論文著者
Advanced Reliable Systems (ares) Laboratory Department Of Electrical Engineering National Central Un | 論文
- An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults(Memory Design and Test,VLSI Design and CAD Algorithms)
- A Multi-Code Compression Scheme for Test Time Reduction of System-on-Chip Designs