Kanda A. | Semiconductor Research Center Matsushita Electric Ind. Co. Ltd.
スポンサーリンク
概要
関連著者
-
OGURA M.
Semiconductor Research Center, Matsushita Electric Industrial, Co., Ltd.
-
Nakabayashi T.
Semiconductor Research Center Matsushita Electric Ind. Co. Ltd.
-
ARAI M.
Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd.
-
YABU T.
Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd.
-
KANDA A.
Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd.
-
Yamada T.
Semiconductor Research Center Matsushita Electric Ind. Co. Ltd.
-
Kanda A.
Semiconductor Research Center Matsushita Electric Ind. Co. Ltd.
-
Kanda A.
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
-
MATSUO I.
Kyoto Research Laboratory, Matsushita Electronics Corporation
-
UKEDA T.
Semiconductor Research Center, Matsushita Electric Ind. Co., Ltd.
-
YAMADA T.
Semiconductor Research Center, Matsushita Electric Ind. Co., Ltd.
-
YAMANAKA M.
Semiconductor Research Center, Matsushita Electric Ind. Co., Ltd.
-
KUDO C.
Kyoto Research Laboratory, Matsushita Electronics Corporation
-
SEGAWA M.
Semiconductor Research Center, Matsushita Electric Ind. Co., Ltd.
-
NISHIO M.
Semiconductor Research Center, Matsushita Electric Ind. Co., Ltd.
-
UEHARA T.
Semiconductor Research Center, Matsushita Electric Ind. Co., Ltd.
-
Ukeda T.
Semiconductor Research Center Matsushita Electric Ind. Co. Ltd.
著作論文
- A Universal Relationship between Boron Penetration and Gate Oxide Reliability for Surface Channel PMOSFET
- High Reliability Trench Isolation Technology with Elevated Field Oxide Structure for Sub-Quarter Micron CMOS Devices