KATO Y. | ULSI Device Development Lab., NEC Corporation

スポンサーリンク

概要

• 同名の論文著者
• ULSI Device Development Lab., NEC Corporationの論文著者

関連著者

• Yabuta H.

  Functional Materials Research Labs. Nec Corporation

• IIZUKA T.

  ULSI Device Development Lab., NEC Corporation

• ARITA K.

  ULSI Device Development Lab., NEC Corporation

• YAMAMOTO I.

  ULSI Device Development Lab., NEC Corporation

• YAMAMICHI S.

  Functional Materials Research Labs., NEC Corporation

• YAMAGUCHI H.

  ULSI Device Development Lab., NEC Corporation

• MATSUKI T.

  ULSI Device Development Lab., NEC Corporation

• SONE S.

  ULSI Device Development Lab., NEC Corporation

• MIYASAKA Y.

  Functional Materials Research Labs., NEC Corporation

• KATO Y.

  ULSI Device Development Lab., NEC Corporation

• Yamamichi S.

  Functional Materials Research Labs. Nec Corporation

• Miyasaka Y.

  Functional Materials Research Labs. Nec Corporation

• Matsuki T.

  Ulsi Device Development Lab. Nec Corporation

• Arita K.

  Ulsi Device Development Lab. Nec Corporation

• Iizuka T.

  Ulsi Device Development Lab. Nec Corporation

• Iizuka T.

  Ulsi Device Development Division Nec Corporation

• Sone S.

  Ulsi Device Development Lab. Nec Corporation

もっと見る 閉じる

著作論文

• Low Temperature Recovery of Ru/(Ba, Sr)TiO_3/Ru Capacitors Degraded by Forming Gas Annealing

スポンサーリンク