TANAKA S. | Microelectronics Engineering Laboratory, Toshiba Corporation, Semiconductor company
スポンサーリンク
概要
関連著者
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TANAKA S.
Microelectronics Engineering Laboratory, Toshiba Corporation, Semiconductor company
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Kumura Y.
Microelectronics Engineering Laboratory Toshiba Corporation Semiconductor Company
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YAMAMOTO K.
Research Laboratory, Santen Pharmaceutical Co., Ltd. and Department of Anatomy, Kinki University Sch
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Arisumi O.
Microelectronics Engineering Laboratory Toshiba Corporation Semiconductor Company
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MORIMOTO T.
Microelectronics Engineering Laboratory, Toshiba Corporation, Semiconductor company
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HIDAKA O.
Microelectronics Engineering Laboratory, Toshiba Corporation, Semiconductor company
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YAMAKAWA K.
Microelectronics Engineering Laboratory, Toshiba Corporation, Semiconductor company
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KANAYA H.
Microelectronics Engineering Laboratory, Toshiba Corporation, Semiconductor company
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IWAMOTO T.
Corporate Manufacturing Engineering Center, Toshiba Corporation
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KUNISHIMA I.
Microelectronics Engineering Laboratory, Toshiba Corporation, Semiconductor company
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Kunishima I.
Microelectronics Engineering Laboratory Toshiba Corporation Semiconductor Company
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FUJITA J.
Fundamental Research Laboratories, NEC Corporation
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Bando Y.
Institute for Chemical Research, Kyoto University
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Tsai J.S.
Microelectronics Research Laboratories, NEC Corporation
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Takeuchi I.
Microelectronics Research Laboratories, NEC Corporation
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Yoshitake T.
Fundamental Research Laboratories, NEC Corporation
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Terashima T.
Institute for Chemical Research, Kyoto University
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Iijima K.
Research Institute for Production Develeopent
著作論文
- Excellent Ferroelectric Properties in PZT Capacitor Cell with Thin SRO Film in Both Top and Bottom Electrodes
- 1P-PS-106 Detection of Gap Anisotropy in YBa_2Cu_3O_