Ohashi K. | Fundamental and Environmental Res. Labs., NEC Corporation
スポンサーリンク
概要
関連著者
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Ohashi K.
Fundamental and Environmental Res. Labs., NEC Corporation
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Linke R.
Nec Laboratories America Inc.
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Nakada M
Fundamental And Environmental Res. Labs. Nec Corporation
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Fujikata J.
Fundamental and Environmental Res. Labs., NEC Corporation
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Ishi T.
Fundamental and Environmental Res. Labs., NEC Corporation
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Yokota H.
Fundamental and Environmental Res. Labs., NEC Corporation
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Kato K.
Fundamental and Environmental Res. Labs., NEC Corporation
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Yanagisawa M.
Fundamental and Environmental Res. Labs., NEC Corporation
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Nakada M.
Fundamental and Environmental Res. Labs., NEC Corporation
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Ishihara K.
Fundamental and Environmental Res. Labs., NEC Corporation
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Thio T.
NEC Laboratories America, Inc.
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Thio T.
Nec Laboratories America Inc.
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Fujikata J.
Fundamental And Environmental Res. Labs. Nec Corporation
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SAITO S.
System Devices Research Laboratories, NEC Corporation
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Ishi T.
Fundamental And Environmental Res. Labs. Nec Corporation
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Kuriyama T.
School Of Biology-oriented Science And Technology Kinki Univ.
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Ando N.
Jisso and Production Technologies Research Laboratories, NEC Corp.
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Masuda N.
Jisso and Production Technologies Research Laboratories, NEC Corp.
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Tamaki N.
Jisso and Production Technologies Research Laboratories, NEC Corp.
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Saito M.
Nano Technology Research Laboratory, Waseda Univ.
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Kato K.
Nano Technology Research Laboratory, Waseda Univ.
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Yamaguchi M.
Graduate School of Engineering, Tohoku Univ.
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Tamaki N.
Jisso And Production Technologies Research Laboratories Nec Corp.
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Ohashi K.
Fundamental And Environmental Research Laboratories Nec Corp.
著作論文
- Surface Plasmon Enhancement Effect and Its Application to Near-Field Optical Recording(Optical Head and Novel Recording Methods)
- Development of Miniaturized Thin-Film Magnetic Field Probes for On-Chip Measurement