Miyata Noriyuki | Joint Research Center For Atom Technology Angstrom Technology Partnership (jrcat-atp) C/o National I
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Joint Research Center For Atom Technology Angstrom Technology Partnership (jrcat-atp) C/o National I | 論文
- Electrical Characterization of Atomic-Scale Defects in an Ultrathin Si Oxynitride Layer
- Electrical Characterization of Atomic-Scale Defects in an Ultrathin Si Oxynitride Layer
- Atomic-Scale Structure of SiO_2/Si(001) Interface Formed by Furnace Oxidation