LIM P. | Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering National Univ

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概要

関連著者

Chim W.
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive
Teh G.
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive
LIM P.
Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering National Univ
YEO B.
Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering National Univ
CHAN D.
Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering National Univ
Yeo B.
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive

著作論文

Latent Damage Generation in Submicrometer MOS Devices Under High-Field Impulse Stressing and Its Characterization Using Flicker Noise Measurement

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