Tserepi Angeliki | Institute Of Microelectronics (imel) Ncsr "demokritos
スポンサーリンク
概要
関連著者
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Gogolides Evangelos
Institute Of Microelectronics (imel) Ncsr "demokritos
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Constantoudis Vassilios
Institute Of Microelectronics (imel) Ncsr "demokritos
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Tserepi Angeliki
Institute Of Microelectronics (imel) Ncsr "demokritos
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Sarris Vassilios
Institute Of Microelectronics (imel) Ncsr "demokritos
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Constantoudis Vassilios
Institute of Microelectronics (IMEL), NCSR “Demokritos”, P.O. Box 60228, Aghia Paraskevi, Attiki, Gr
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Patsis George
Institute of Microelectronics (IMEL), NCSR “Demokritos”, P.O. Box 60228, Aghia Paraskevi, Attiki, Gr
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Tserepi Angeliki
Institute of Microelectronics (IMEL), NCSR “Demokritos”, P.O. Box 60228, Aghia Paraskevi, Attiki, Gr
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Diakoumakos Constantinos
Institute of Microelectronics (IMEL), NCSR “Demokritos”, P.O. Box 60228, Aghia Paraskevi, Attiki, Gr
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Valamontes Evangelos
Technological Educational Institute of Athens, Aegaleo, Greece 12210
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Patsis George
Institute Of Microelectronics (imel) Ncsr "demokritos
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Valamontes Evangelos
Technological Educational Institute Of Athens
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Diakoumakos Constantinos
Institute Of Microelectronics (imel) Ncsr "demokritos
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Tserepi Angeliki
Institute of Microelectronics, NCSR "Demokritos", POB 60228, 153 10 Aghia Paraskevi, Greece
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Tsougeni Katerina
Institute of Microelectronics, NCSR "Demokritos", POB 60228, 153 10 Aghia Paraskevi, Greece
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Boulousis George
Institute of Microelectronics, NCSR "Demokritos", POB 60228, 153 10 Aghia Paraskevi, Greece
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Tsougeni Katerina
Institute of Microelectronics, NCSR "Demokritos", POB 60228, 153 10 Aghia Paraskevi, Greece
著作論文
- Tunable Poly(dimethylsiloxane) Topography in O2 or Ar Plasmas for Controlling Surface Wetting Properties and Their Ageing
- Fractal Roughness of Polymers after Lithographic Processing