Nishino T | Division Of Science And Materials The Graduate School Of Science And Technology Kobe University:depa
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Division Of Science And Materials The Graduate School Of Science And Technology Kobe University:depa | 論文
- Hydrogenated Amorphous Silicon/Crystalline Silicon Double Heterojunction X-Ray Sensor
- LPE Growth of InGa_xP_As_on GaAs Substrate by Two-Phase Melt Method.
- Measurement of Residual Stress in Bent Silicon Wafers by Means of Photoluminescence
- Characterization of Thermally-Induced Defects in CZ-Si by Room-Temperature Photoluminescence
- Oxygen-Related Donors Stable at 700-800℃ in CZ-Si Crystals