Takegawa Youichi | Research Institute Of Electrical Communication Tohoku University:(present Address) Research & De
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- 同名の論文著者
- Research Institute Of Electrical Communication Tohoku University:(present Address) Research & Deの論文著者
Research Institute Of Electrical Communication Tohoku University:(present Address) Research & De | 論文
- Growth Mode and Characteristics of the O_2-Oxidized Si(100) Surface Oxide Layer Observed by Real Time Photoemission Measurement
- Elevated Polycide Source/Drain Shallow Junctions with Advanced Silicidation Processing and Al Plug/Collimated PVD (Physical Vapor Deposition)- Ti/TiN/Ti/Polycide Contact for Deep-Submicron Complementary Metal-Oxide Semiconductors