Fukuda Hiroaki | Interdisciplinary Graduate School Of Science And Engineering Tokyo Institute Of Technology:research
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Interdisciplinary Graduate School Of Science And Engineering Tokyo Institute Of Technology:research | 論文
- Estimation of the Minority Carrier Diffusion Length by Near-Field Photocurrent Measurement of p-n Junction in Silicon using Multiwavelength Excitation
- Near-Field Photocurrent Measurements of Si p-n Junction under the Reverse-Bias Condition : Optical Properties of Condensed Matter