ITO Takashi | Tohoku University
スポンサーリンク
概要
関連著者
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Kotani Koji
Tohoku Univ. Sendai‐shi Jpn
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ITO Takashi
Tohoku University
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Zhu Xiaoli
Tohoku University
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KUROKI Shin-Ichiro
Tohoku University
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Kotani K
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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Kotani K
Tohoku Univ. Sendai‐shi Jpn
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MISHIMA Yasuyoshi
Fujitsu Laboratories Ltd.
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FUKUDA Masatoshi
Fujitsu Laboratories Ltd.
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SHIDO Hideharu
Fujitsu Laboratories Ltd.
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Kotani Koji
Tohoku University
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Mishima Yasuyoshi
Advanced Cmos Labolatories Fujitsu Laboratories Ltd.
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Shido Hideharu
Advanced Cmos Labolatories Fujitsu Laboratories Ltd.
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Fukuda Masatoshi
Advanced Cmos Labolatories Fujitsu Laboratories Ltd.
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Fukuda Masatoshi
Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan
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Kotani Koji
Tohoku University, 6-6-05 Aza-Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan
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Shido Hideharu
Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan
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Ito Takashi
Tohoku University, 6-6-05 Aza-Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan
著作論文
- Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels
- The Drivability Enhancement Mechanisms in Nano-grating MOSFETs
- Self-Vth-Cancellation High-Efficiency CMOS Rectifier Circuit for UHF RFIDs
- Analysis of Drivability Enhancement Factors in Nanograting Metal–Oxide–Semiconductor Field-Effect Transistors