SHINOHARA Noriaki | Kagawa University, Dept. of Advanced Materials Science, Faculty of Engineering

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概要

関連著者

Kotaki Hiroshi
Sharp Corporation Corporate Research And Development Group
Toki Atsushi
Kagawa University Dept. Of Advanced Materials Science Faculty Of Engineering
Kamigaki Yoshiaki
Kagawa University Dept. Of Advanced Materials Science Faculty Of Engineering
SHINOHARA Noriaki
Kagawa University, Dept. of Advanced Materials Science, Faculty of Engineering
NAKANO Masayuki
Sharp Corporation, Corporate Research and Development Group
Nakano Masayuki
Sharp Corporation Corporate Research And Development Group
Shinohara Noriaki
Kagawa University Dept. Of Advanced Materials Science Faculty Of Engineering

著作論文

ESR and PL Study of Charge Trapping Centers in Silicon Nitride Films and Its Verification with Novel ONO-Sidewall 2-bit/cell Nonvolatile Memory

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