Yamamoto Sekika | Department Of Physics College Of General Education Osaka University
スポンサーリンク
概要
関連著者
-
Yamamoto Sekika
Department Of Physics College Of General Education Osaka University
-
Ohyama Tyuzi
Department Of Physics College Of General Education Osaka University
-
YAMAMOTO Sekika
Department of Physics, College of General Education, Osaka University
-
Otsuka Eizo
Department of Applied Physics, Osaka University
-
OHYAMA Tyuzi
Department of Physics, Graduate School of Science, Osaka University
-
Ohyama Teruo
Department Of Physics Gakushuin Univ
-
Iwami Motohiro
Research Laboratory For Surface Science Faculty Of Science Okayama University
-
Otsuka Eizo
Department Of Physics College Of General Education Osaka University
-
Ohyama Tyuzi
Department Of Physics Graduate School Of Science Osaka University
-
Iwami Motohiro
Reseach Laboratory For Surface Science Faculty Of Science Okayama University
-
YAMAUCHI Syouichi
Research Laboratory for Surface Science, Faculty of Science, Okayama University
-
Yamamoto Sekika
Department Of Physics Graduate School Of Science Osaka University:(present Address)division Of Physi
-
Otsuka Eizo
Department Of Applied Physics Osaka City University
-
Yamauchi Syouichi
Research Laboratory For Surface Science Faculty Of Science Okayama University
-
Sakuma Hikari
Department of Physics, Graduate School of Science, Hokkaido University, N10W8, Sapporo 060-0810, Japan
-
OHYAMA Tyuzi
Department of Physics, College of General Education, Osaka University
-
OTSUKA Eizo
Department of Physics, College of General Education, Osaka University
-
Yamamoto Sekika
Department of Physics, Graduate School of Science, Hokkaido University, N10W8, Sapporo 060-0810, Japan
-
Mishina Tomobumi
Department of Physics, Graduate School of Science, Hokkaido University, N10W8, Sapporo 060-0810, Japan
著作論文
- Exciton Luminescence Dynamics in ZnO Crystal Observed under One- and Two-Photon Excitation
- Influence of Interface Barrier on Lateral Transport Properties for Metal/Semiconductor Systems
- Electron Scattering by Mu Impurities in Si Detected by Cyclotron Resonance Measurement