Chou Chang-pin | Department Of Mechanical Engineering National Chiao Tung University
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概要
- CHOU Chang-Pinの詳細を見る
- 同名の論文著者
- Department Of Mechanical Engineering National Chiao Tung Universityの論文著者
関連著者
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Chou Chang-pin
Department Of Mechanical Engineering National Chiao Tung University
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Mcalister Sean
Institute For Microstructural Sciences National Research Council Of Canada
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Chin Albert
Department Of Electronic Engineering National Chiao Tung University
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Huang Kuo-cheng
Instrument Technology Research Center National Applied Research Laboratories
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Sze Jyh-rou
Instrument Technology Research Center National Applied Research Laboratories
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HUANG Chien-Yao
Instrument Technology Research Center, National Applied Research Laboratories
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KUO Chao-Hui
Instrument Technology Research Center, National Applied Research Laboratories
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TSENG Shih-Feng
Instrument Technology Research Center, National Applied Research Laboratories
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CHOU Chang-Pin
Department of Mechanical Engineering, National Chiao Tung University
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Kuo Chao-hui
Instrument Technology Research Center National Applied Research Laboratories
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Huang Chien-yao
Instrument Technology Research Center National Applied Research Laboratories
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Tseng Shih-feng
Instrument Technology Research Center National Applied Research Laboratories
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Pan Han-Chang
Instrument Technology Research Center, National Applied Research Labs, Hsinchu 300, Taiwan, R.O.C.
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Cheng Chun-Hu
Department of Mechanical Engineering, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.
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Chiang Kuo-Cheng
Department of Electronics Engineering, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.
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Chou Chang-Pin
Department of Mechanical Engineering, National Chiao-Tung University, Hsinchu 300, Taiwan, R.O.C.
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Hsiao Chien-Nan
Instrument Technology Research Center, National Applied Research Labs, Hsinchu 300, Taiwan, R.O.C.
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McAlister Sean
Institute for Microstructural Sciences, National Research Council of Canada, Ottawa, Canada
著作論文
- The Glass-Molding Process for Planar-Integrated Micro-Optical Component
- Improved Stress Reliability of Analog TiHfO Metal–Insulator–Metal Capacitors Using High-Work-Function Electrode