Kanno Shohei | Optoelectronic Device System R & D Center Kanazawa Institute Of Technology
スポンサーリンク
概要
関連著者
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Kanno Shohei
Optoelectronic Device System R & D Center Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronic Device System R & D Center Kanazawa Institute Of Technology
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Tamura Keimei
Department Of Electrical Engineering Kanazawa Technical College
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Kato Kyoko
Information And Computer Engineering Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronic Device System RD Center, Kanazawa Institute of Technology
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Tokunaga Y
Optoelectronic Device System R&d Center Kanazawa Institute Of Technology
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Kanno S
Optoelectronic Device System R&d Center Kanazawa Institute Of Technology
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Sawabe Yuuya
Optoelectronic Device System R&D Center, Kanazawa Institute of Technology
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Sawabe Yuuya
Optoelectronic Device System R&d Center Kanazawa Institute Of Technology
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Hong Yuntei
Optoelectronic Device System R & D Center, Kanazawa Institute of Technology
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Hong Yuntei
Optoelectronic Device System R & D Center Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronic Device System R&D Center, Kanazawa Institute of Technology, 7-1 Ohgigaoka, Nonoichi, Ishikawa 921-8501, Japan
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Kato Kyoko
Information and Computer Engineering, Kanazawa Institute of Technology, 7-1 Ohgigaoka, Nonoichi, Ishikawa 921-8501, Japan
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Okayama Toshinori
Optoelectronic Device System R&D Center, Kanazawa Institute of Technology, 7-1 Ohgigaoka, Nonoichi, Ishikawa 921-8501, Japan
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Okayama Toshinori
Optoelectronic Device System R&D Center, Kanazawa Institute of Technology, 7-1 Ohgigaoka, Nonoichi, Ishikawa 921-8501, Japan
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Kanno Shohei
Optoelectronic Device System R&D Center, Kanazawa Institute of Technology, 7-1 Ohgigaoka, Nonoichi, Ishikawa 921-8501, Japan
著作論文
- Numerical simulation of dynamics of GHz acoustic phonon fluxes amplified from thermal background phonons in a n-type CdS single crystal
- Discussion about light modulation dependence on photoacoustic amplitude in silver thin film
- Study of Photoacoustic Three-Dimensional Imaging by the Simultaneous Measurement of Multiple Frequencies Method