ANG D. | Nanyang Technological University, School of Electrical and Electronic Engineering

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概要

関連著者

TUNG C.
Institute of Microelectronics
Ling C.
National University Of Singapore Department Of Electrical And Computer Engineering
PHUA T.
National University of Singapore, Department of Electrical and Computer Engineering
ANG D.
Nanyang Technological University, School of Electrical and Electronic Engineering
Phua T.
National University Of Singapore Department Of Electrical And Computer Engineering
Ang D.
Nanyang Technological University School Of Electrical And Electronic Engineering

著作論文

Self-Heating Induced Germanium Outdiffusion and Non-Local Channel Degradation in the Strained-Si/SiGe N-MOSFET subjected to Channel Hot-Electron Stress

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