Lee G.-h. | Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University

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概要

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• 同名の論文著者
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関連著者

• Chung Steve

  Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University

• Chung Steve

  Department Of Electrical Engineering National Tsing-hua University

• Lee G.-h.

  Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University

著作論文

• A Novel Technique for Investigating Hot-Electron-Induced Oxide Damages and Device Degradations in Submicron LDD n-MOSFET's

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