Morihira Yasushi | Tokyo Instruments Inc.
スポンサーリンク
概要
関連著者
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Morihira Yasushi
Tokyo Instruments Inc.
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Sheng Ping
Department Of Physics And Institute Of Nano Science And Technology Hong Kong University Of Science A
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NAKA Nobuko
Department of Physics, Graduate School of Science, The University of Tokyo
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MORIHIRA Yasushi
Tokyo Instruments, Inc.
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NAGASAWA Nobukata
Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science
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Ge Wei-kun
Department Of Physics And Institute Of Nano Science And Technology Hong Kong University Of Science A
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Tang Zi-kang
Department Of Physics And Institute Of Nano Science And Technology Hong Kong University Of Science A
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Ye Jian-ting
Department Of Physics And Institute Of Nano Science And Technology Hong Kong University Of Science A
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Taniguchi Jun
Department Of Applied Electronics Tokyo University Of Science
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Kudryashov Igor
Tokyo Instrument Inc.
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OSARI Kazutomo
Department of Applied Electronics, Tokyo University of Science
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Osari Kazutomo
Department Of Applied Electronics Tokyo University Of Science
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Naka Nobuko
Department of Physics, Graduate School of Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Ye Jian-Ting
Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Kowloon, Hong Kong, China
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Nagasawa Nobukata
Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Kowloon, Hong Kong, China
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Tang Zi-Kang
Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Kowloon, Hong Kong, China
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Ge Wei-Kun
Department of Physics and Institute of Nano Science and Technology, Hong Kong University of Science and Technology, Kowloon, Hong Kong, China
著作論文
- A30 Strain field in Si mold on UV-nanoimprint lithography(M4 processes and micro-manufacturing for science)
- Optical Micro-Characterization of Single-Walled Carbon Nanotubes Extracted from AFI Crystals by Visible Emission and Raman Scattering