KUO Kang-Min | Rm 446, Department of Electrical Engineering, National Taiwan University

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概要

関連著者

Hwu Jenn-gwo
Rm 446 Department Of Electrical Engineering National Taiwan University
Wu You-lin
Rm 446 Department Of Electrical Engineering National Taiwan University
KUO Kang-Min
Rm 446, Department of Electrical Engineering, National Taiwan University
Kuo Kang-min
Rm 446 Department Of Electrical Engineering National Taiwan University

著作論文

Reduction of Radiation-Induced Degradation in n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFET's) with Gate Oxides Prepared by Repeated Rapid Thermal N_2O Annealing

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