LIN Jung-Jenn | Room 414, Department of Electrical Engineering, National Taiwan University

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概要

関連著者

Lin Kuan-chin
Room 414 Department Of Electrical Engineering National Taiwan University
Hwu Jenn-gwo
Room 414 Department Of Electrical Engineering National Taiwan University
LIN Jung-Jenn
Room 414, Department of Electrical Engineering, National Taiwan University
Lin Jung-jenn
Room 414 Department Of Electrical Engineering National Taiwan University

著作論文

Dependence of Hot-Carrier and Radiation Hardnesses of Metal-Oxide-Semiconductor Capacitors on Initial Oxide Resistance Determined by Charge-Then-Decay Method

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