NAKAZATO K. | Hitachi Cambridge Laboratory, Hitachi Europe Ltd.
スポンサーリンク
概要
関連著者
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NAKAZATO K.
Hitachi Cambridge Laboratory, Hitachi Europe Ltd.
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Durrani Z.
Microelectronics Research Centre University Of Cambridge
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Cleaver J.r.a.
Microelectronics Research Center Cavendish Laboratory Cambridge University
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TAN Y.
Microelectronics Research Center, Cavendish Laboratory, University of Cambridge
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KAMIYA T.
Microelectronics Research Center, Cavendish Laboratory, University of Cambridge
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FURUTA Y.
Hitachi Cambridge Laboratory, Hitachi Europe Ltd.
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MIZUTA H.
Hitachi Cambridge Laboratory, Hitachi Europe Ltd.
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TANIGUCHI K.
Dept. of Electronics and Information Systems, Osaka University
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Williams D.a.
Hitachi Cambridge Laboratory Hitachi Europe Ltd.
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Tan Y.
Microelectronics Research Centre University Of Cambridge
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MUELLER H.H.
Microelectronics Research Center, Cavendish Laboratory, Cambridge University
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CHEN W.
Microelectronics Research Center, Cavendish Laboratory, Cambridge University
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WHITE J.D.
Hitachi Cambridge Laboratory, Hitachi Europe Ltd.
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ALLAM J.
Hitachi Cambridge Laboratory, Hitachi Europe Ltd.,
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White J.d.
Hitachi Cambridge Laboratory Hitachi Europe Ltd.
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Mueller H.h.
Microelectronics Research Center Cavendish Laboratory Cambridge University
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Allam J.
Hitachi Cambridge Laboratory Hitachi Europe Ltd.
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KAMIYA T.
Microelectronics Research Centre, University of Cambridge
著作論文
- Characterization of Tunnel-Barriers in Polycrystalline Si Point-Contact Single-Electron Transistors
- Multistability at the Tunneling -Ballistic Boundary in a Mesoscopic Device