OKUSHIMA Mototsugu | ULSI Device Development Laboratory, NEC Corporation

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概要

• 同名の論文著者
• ULSI Device Development Laboratory, NEC Corporationの論文著者

関連著者

• Noguchi Ko

  Ulsi Device Development Laboratories Nec Corporation

• OKUSHIMA Mototsugu

  ULSI Device Development Laboratory, NEC Corporation

• Okushima Mototsugu

  Ulsi Device Development Laboratory Nec Corporation

著作論文

• Influence of Gate Oxide Quality on Plasma Process-Induced Charging Damage in Ultra Thin Gate Oxide

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